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- ARM Macro Assembler Page 1
- 1 00000000 ;*******************************************************
- ***********************
- 2 00000000
- 3 00000000 THUMB
- 4 00000000 REQUIRE8
- 5 00000000 PRESERVE8
- 6 00000000
- 7 00000000 AREA |.text|, CODE, READONLY, ALIGN=
- 2
- 8 00000000
- 9 00000000 ; Reference to the FailSafe routine to be executed in ca
- se of non-recoverable
- 10 00000000 ; failure
- 11 00000000 IMPORT FailSafePOR
- 12 00000000
- 13 00000000 ;*******************************************************
- ************************
- 14 00000000 ; Function Name : STL_TranspRamMarchCXStep
- 15 00000000 ; Description : Transparent RAM walkpat test for run
- time
- 16 00000000 ; Input : R0 .. RAM begin (first address to tes
- t),
- 17 00000000 ; R1 .. Buffer begin (First address of
- backup buffer)
- 18 00000000 ; R2 .. Background pattern
- 19 00000000
- 20 00000000 ; R4 .. test cell data
- 21 00000000 ; R5 .. cout for words test loop addres
- s offset
- 22 00000000 ; R6 .. read data
- 23 00000000 ; R7 .. befor/next cell address
- 24 00000000 ; R8 .. Background data 0 OR 0xFFFFFFFF
-
- 25 00000000 ; R9 .. cout for word test loop
- 26 00000000 ; Return : TEST_SUCCESSFULL (=1)
- 27 00000000 ;*******************************************************
- ************************/
- 28 00000000 STU_RamWalkpatStep
- PROC ;195.6us
- 29 00000000 EXPORT STU_RamWalkpatStep
- 30 00000000
- 31 00000000 E92D 03F0 PUSH {R4-R9}
- 32 00000004
- 33 00000004 2400 MOVS R4, #0
- 34 00000006 2500 MOVS R5, #0
- 35 00000008 __BACKUP_LOOP ;save content of th
- e RAM slice into th
- e backup buffer and
- reset test uint
- 36 00000008 5946 LDR R6,[R0, R5]
- 37 0000000A 514E STR R6,[R1, R5]
- 38 0000000C 5144 STR R4,[R0, R5] ;reset test word
- 39 0000000E F105 0504 ADD R5,R5,#4
- 40 00000012 2D18 CMP R5, #24
- 41 00000014 DBF8 BLT __BACKUP_LOOP
- 42 00000016
- 43 00000016 ;********************* Walkpat 1 ***********************
- ***
- 44 00000016 2504 MOVS R5, #4
- ARM Macro Assembler Page 2
- 45 00000018 F05F 0800 MOVS R8, #0
- 46 0000001C __STEP_TEST_WORDS_LOOP
- 47 0000001C 2401 MOVS R4,#0x01
- 48 0000001E F05F 0901 MOVS R9, #1
- 49 00000022 __STEP_TEST_WORD_LOOP
- 50 00000022 5144 STR R4,[R0, R5] ;set one bit ,and V
- erify
- 51 00000024 5946 LDR R6,[R0, R5]
- 52 00000026 42B4 CMP R4,R6
- 53 00000028 D15F BNE __STEP_ERR
- 54 0000002A
- 55 0000002A F105 0704 ADD R7,R5,#4 ;Verify next word
- 56 0000002E 59C6 LDR R6,[R0, R7]
- 57 00000030 45B0 CMP R8,R6
- 58 00000032 D15A BNE __STEP_ERR
- 59 00000034
- 60 00000034 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 61 00000036 59C6 LDR R6,[R0, R7]
- 62 00000038 45B0 CMP R8,R6
- 63 0000003A D156 BNE __STEP_ERR
- 64 0000003C
- 65 0000003C F840 8005 STR R8,[R0, R5] ;reset ont bit ,and
- Verify
- 66 00000040 5946 LDR R6,[R0, R5]
- 67 00000042 45B0 CMP R8,R6
- 68 00000044 D151 BNE __STEP_ERR
- 69 00000046
- 70 00000046 F105 0704 ADD R7,R5,#4 ;Verify next word
- 71 0000004A 59C6 LDR R6,[R0, R7]
- 72 0000004C 45B0 CMP R8,R6
- 73 0000004E D14C BNE __STEP_ERR
- 74 00000050
- 75 00000050 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 76 00000052 59C6 LDR R6,[R0, R7]
- 77 00000054 45B0 CMP R8,R6
- 78 00000056 D148 BNE __STEP_ERR
- 79 00000058
- 80 00000058 EA4F 0444 LSL R4,#1 ;Test data moved on
- e place to the left
-
- 81 0000005C F109 0901 ADD R9,R9,#1
- 82 00000060 F1B9 0F20 CMP R9,#32
- 83 00000064 DDDD BLE __STEP_TEST_WORD_LOOP
- 84 00000066
- 85 00000066 F105 0504 ADD R5,R5,#4 ;Test next word
- 86 0000006A 2D14 CMP R5, #20
- 87 0000006C DBD6 BLT __STEP_TEST_WORDS_LOOP
- 88 0000006E
- 89 0000006E ;********************* Walkpat 0 ***********************
- ***
- 90 0000006E F05F 34FF MOVS R4, #0xFFFFFFFF
- 91 00000072 2500 MOVS R5, #0
- 92 00000074 __BACKGROUND_LOOP
- 93 00000074 5144 STR R4,[R0, R5] ;set test word
- 94 00000076 F105 0504 ADD R5,R5,#4
- 95 0000007A 2D18 CMP R5, #24
- 96 0000007C DBFA BLT __BACKGROUND_LOOP
- ARM Macro Assembler Page 3
- 97 0000007E
- 98 0000007E 2504 MOVS R5, #4
- 99 00000080 F05F 38FF MOVS R8, #0xFFFFFFFF
- 100 00000084 __STEP_TEST_WORDS_LOOP_2
- 101 00000084 F07F 4400 MOVS R4,#0x7FFFFFFF
- 102 00000088 F05F 0901 MOVS R9, #1
- 103 0000008C __STEP_TEST_WORD_LOOP_2
- 104 0000008C 5144 STR R4,[R0, R5] ;set one bit ,and V
- erify
- 105 0000008E 5946 LDR R6,[R0, R5]
- 106 00000090 42B4 CMP R4,R6
- 107 00000092 D12A BNE __STEP_ERR
- 108 00000094
- 109 00000094 F105 0704 ADD R7,R5,#4 ;Verify next word
- 110 00000098 59C6 LDR R6,[R0, R7]
- 111 0000009A 45B0 CMP R8,R6
- 112 0000009C D125 BNE __STEP_ERR
- 113 0000009E
- 114 0000009E 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 115 000000A0 59C6 LDR R6,[R0, R7]
- 116 000000A2 45B0 CMP R8,R6
- 117 000000A4 D121 BNE __STEP_ERR
- 118 000000A6
- 119 000000A6 F840 8005 STR R8,[R0, R5] ;reset ont bit ,and
- Verify
- 120 000000AA 5946 LDR R6,[R0, R5]
- 121 000000AC 45B0 CMP R8,R6
- 122 000000AE D11C BNE __STEP_ERR
- 123 000000B0
- 124 000000B0 F105 0704 ADD R7,R5,#4 ;Verify next word
- 125 000000B4 59C6 LDR R6,[R0, R7]
- 126 000000B6 45B0 CMP R8,R6
- 127 000000B8 D117 BNE __STEP_ERR
- 128 000000BA
- 129 000000BA 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 130 000000BC 59C6 LDR R6,[R0, R7]
- 131 000000BE 45B0 CMP R8,R6
- 132 000000C0 D113 BNE __STEP_ERR
- 133 000000C2
- 134 000000C2 EA4F 0474 ROR R4,#1 ;Test data moved on
- e place to the left
-
- 135 000000C6 F109 0901 ADD R9,R9,#1
- 136 000000CA F1B9 0F20 CMP R9,#32
- 137 000000CE DDDD BLE __STEP_TEST_WORD_LOOP_2
- 138 000000D0
- 139 000000D0 F105 0504 ADD R5,R5,#4 ;Test next word
- 140 000000D4 2D14 CMP R5, #20
- 141 000000D6 DBD5 BLT __STEP_TEST_WORDS_LOOP_2
- 142 000000D8
- 143 000000D8 2500 MOVS R5, #0
- 144 000000DA __RESTORE_LOOP ;restore content of
- the RAM slice back
- from the backup bu
- ffer
- 145 000000DA 594E LDR R6,[R1, R5]
- 146 000000DC 5146 STR R6,[R0, R5]
- ARM Macro Assembler Page 4
- 147 000000DE F105 0504 ADD R5,R5,#4
- 148 000000E2 2D18 CMP R5, #24
- 149 000000E4 DBF9 BLT __RESTORE_LOOP
- 150 000000E6
- 151 000000E6 2001 MOVS R0, #1 ; Correct return
- 152 000000E8 E000 B __STEP_RET
- 153 000000EA
- 154 000000EA __STEP_ERR
- 155 000000EA 2000 MOVS R0, #0 ; error result
- 156 000000EC
- 157 000000EC __STEP_RET
- 158 000000EC E8BD 03F0 POP {R4-R9}
- 159 000000F0 4770 BX LR ; return to the cal
- ler
- 160 000000F2 ENDP
- 161 000000F2
- 162 000000F2 ;*******************************************************
- ************************
- 163 000000F2 ; Function Name : STL_TranspRamMarchCXStep
- 164 000000F2 ; Description : Transparent walkpat test for startup
- 165 000000F2 ; Input : R0 .. RAM begin (first address to tes
- t),
- 166 000000F2 ; R1 .. RAM size (byte)
- 167 000000F2 ; R2 .. Background pattern
- 168 000000F2
- 169 000000F2 ; R4 .. test cell data
- 170 000000F2 ; R5 .. cout for words test loop addres
- s offset
- 171 000000F2 ; R6 .. read data
- 172 000000F2 ; R7 .. befor/next cell address
- 173 000000F2 ; R8 .. Background data 0 OR 0xFFFFFFFF
-
- 174 000000F2 ; R9 .. cout for word test loop
- 175 000000F2 ; Return : TEST_SUCCESSFULL (=1)
- 176 000000F2 ;*******************************************************
- ************************/
- 177 000000F2 STU_FullRamWalkpat
- PROC
- 178 000000F2 EXPORT STU_FullRamWalkpat
- 179 000000F2
- 180 000000F2 E92D 03F0 PUSH {R4-R9}
- 181 000000F6
- 182 000000F6 ;********************* Walkpat 1 ***********************
- ***
- 183 000000F6 2400 MOVS R4, #0
- 184 000000F8 2500 MOVS R5, #0
- 185 000000FA __FULL_LOOP_1 ;reset test uint
- 186 000000FA 5144 STR R4,[R0, R5] ;reset test word
- 187 000000FC F105 0504 ADD R5,R5,#4
- 188 00000100 428D CMP R5, R1
- 189 00000102 DBFA BLT __FULL_LOOP_1 ;带符号数小于
- 190 00000104
- 191 00000104 2500 MOVS R5, #0
- 192 00000106 F05F 0800 MOVS R8, #0
- 193 0000010A __FULL_TEST_WORDS_LOOP
- 194 0000010A 2401 MOVS R4,#0x01
- 195 0000010C F05F 0901 MOVS R9, #1
- 196 00000110 __FULL_TEST_WORD_LOOP
- 197 00000110 5144 STR R4,[R0, R5] ;set one bit ,and V
- ARM Macro Assembler Page 5
- erify
- 198 00000112 5946 LDR R6,[R0, R5]
- 199 00000114 42B4 CMP R4,R6
- 200 00000116 D168 BNE __FULL_ERR
- 201 00000118
- 202 00000118 2D00 CMP R5, #0
- 203 0000011A D003 BEQ __VERIFY_NEXT_1
- 204 0000011C
- 205 0000011C 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 206 0000011E 59C6 LDR R6,[R0, R7]
- 207 00000120 45B0 CMP R8,R6
- 208 00000122 D162 BNE __FULL_ERR
- 209 00000124
- 210 00000124 __VERIFY_NEXT_1
- 211 00000124 F105 0704 ADD R7,R5,#4 ;Verify next word
- 212 00000128 428F CMP R7, R1
- 213 0000012A DA02 BGE __FULL_STEP_3
- 214 0000012C 59C6 LDR R6,[R0, R7]
- 215 0000012E 45B0 CMP R8,R6
- 216 00000130 D15B BNE __FULL_ERR
- 217 00000132
- 218 00000132 __FULL_STEP_3
- 219 00000132 F840 8005 STR R8,[R0, R5] ;reset one bit ,and
- Verify
- 220 00000136 5946 LDR R6,[R0, R5]
- 221 00000138 45B0 CMP R8,R6
- 222 0000013A D156 BNE __FULL_ERR
- 223 0000013C
- 224 0000013C 2D00 CMP R5, #0
- 225 0000013E D003 BEQ __VERIFY_NEXT_2
- 226 00000140
- 227 00000140 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 228 00000142 59C6 LDR R6,[R0, R7]
- 229 00000144 45B0 CMP R8,R6
- 230 00000146 D150 BNE __FULL_ERR
- 231 00000148
- 232 00000148 __VERIFY_NEXT_2
- 233 00000148 F105 0704 ADD R7,R5,#4 ;Verify next word
- 234 0000014C 428F CMP R7, R1
- 235 0000014E DA02 BGE __FULL_STEP_4
- 236 00000150 59C6 LDR R6,[R0, R7]
- 237 00000152 45B0 CMP R8,R6
- 238 00000154 D149 BNE __FULL_ERR
- 239 00000156
- 240 00000156 __FULL_STEP_4
- 241 00000156 EA4F 0444 LSL R4,#1 ;Test data moved on
- e place to the left
-
- 242 0000015A F109 0901 ADD R9,R9,#1
- 243 0000015E F1B9 0F20 CMP R9,#32
- 244 00000162 DDD5 BLE __FULL_TEST_WORD_LOOP ;小于等于
-
- 245 00000164
- 246 00000164 F105 0504 ADD R5,R5,#4 ;Test next word
- 247 00000168 428D CMP R5, R1
- 248 0000016A DBCE BLT __FULL_TEST_WORDS_LOOP
- 249 0000016C
- ARM Macro Assembler Page 6
- 250 0000016C
- 251 0000016C ;********************* Walkpat 0 ***********************
- ***
- 252 0000016C F05F 34FF MOVS R4, #0xFFFFFFFF
- ;background data
- 253 00000170 2500 MOVS R5, #0
- 254 00000172 __FULL_LOOP_2
- 255 00000172 5144 STR R4,[R0, R5] ;set test word
- 256 00000174 F105 0504 ADD R5,R5,#4
- 257 00000178 428D CMP R5, R1
- 258 0000017A DBFA BLT __FULL_LOOP_2 ;带符号数小于
- 259 0000017C
- 260 0000017C 2500 MOVS R5, #0
- 261 0000017E F05F 38FF MOVS R8, #0xFFFFFFFF
- 262 00000182 __FULL_TEST_WORDS_LOOP_2
- 263 00000182 F07F 4400 MOVS R4,#0x7FFFFFFF ;first test data
-
- 264 00000186 F05F 0901 MOVS R9, #1
- 265 0000018A __FULL_TEST_WORD_LOOP_2
- 266 0000018A 5144 STR R4,[R0, R5] ;set one bit ,and V
- erify
- 267 0000018C 5946 LDR R6,[R0, R5]
- 268 0000018E 42B4 CMP R4,R6
- 269 00000190 D12B BNE __FULL_ERR
- 270 00000192
- 271 00000192 2D00 CMP R5, #0
- 272 00000194 D003 BEQ __VERIFY_NEXT_3
- 273 00000196
- 274 00000196 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 275 00000198 59C6 LDR R6,[R0, R7]
- 276 0000019A 45B0 CMP R8,R6
- 277 0000019C D125 BNE __FULL_ERR
- 278 0000019E
- 279 0000019E __VERIFY_NEXT_3
- 280 0000019E F105 0704 ADD R7,R5,#4 ;Verify next word
- 281 000001A2 428F CMP R7, R1
- 282 000001A4 DA02 BGE __FULL_STEP_5
- 283 000001A6 59C6 LDR R6,[R0, R7]
- 284 000001A8 45B0 CMP R8,R6
- 285 000001AA D11E BNE __FULL_ERR
- 286 000001AC
- 287 000001AC __FULL_STEP_5
- 288 000001AC F840 8005 STR R8,[R0, R5] ;set one bit ,and V
- erify
- 289 000001B0 5946 LDR R6,[R0, R5]
- 290 000001B2 45B0 CMP R8,R6
- 291 000001B4 D119 BNE __FULL_ERR
- 292 000001B6
- 293 000001B6 2D00 CMP R5, #0
- 294 000001B8 D003 BEQ __VERIFY_NEXT_4
- 295 000001BA
- 296 000001BA 1F2F SUBS R7,R5,#4 ;Verify before word
-
- 297 000001BC 59C6 LDR R6,[R0, R7]
- 298 000001BE 45B0 CMP R8,R6
- 299 000001C0 D113 BNE __FULL_ERR
- 300 000001C2
- 301 000001C2 __VERIFY_NEXT_4
- ARM Macro Assembler Page 7
- 302 000001C2 F105 0704 ADD R7,R5,#4 ;Verify next word
- 303 000001C6 428F CMP R7, R1
- 304 000001C8 DA02 BGE __FULL_STEP_6
- 305 000001CA 59C6 LDR R6,[R0, R7]
- 306 000001CC 45B0 CMP R8,R6
- 307 000001CE D10C BNE __FULL_ERR
- 308 000001D0
- 309 000001D0 __FULL_STEP_6
- 310 000001D0 EA4F 0474 ROR R4,#1 ;Test data moved on
- e place to the righ
- t
- 311 000001D4 F109 0901 ADD R9,R9,#1
- 312 000001D8 F1B9 0F20 CMP R9,#32
- 313 000001DC DDD5 BLE __FULL_TEST_WORD_LOOP_2
- ;小于等于
- 314 000001DE
- 315 000001DE F105 0504 ADD R5,R5,#4 ;Test next word
- 316 000001E2 428D CMP R5, R1
- 317 000001E4 DBCD BLT __FULL_TEST_WORDS_LOOP_2
- 318 000001E6
- 319 000001E6
- 320 000001E6 2001 MOVS R0, #1 ; Correct return
- 321 000001E8 E000 B __FULL_RET
- 322 000001EA
- 323 000001EA __FULL_ERR
- 324 000001EA 2000 MOVS R0, #0 ; error result
- 325 000001EC
- 326 000001EC __FULL_RET
- 327 000001EC E8BD 03F0 POP {R4-R9}
- 328 000001F0 4770 BX LR ; return to the cal
- ler
- 329 000001F2 ENDP
- 330 000001F2
- 331 000001F2 END
- Command Line: --debug --xref --diag_suppress=9931 --cpu=Cortex-M3 --apcs=interw
- ork --depend=.\qd007a_ctl_app\stm32f1xx_sturamwalkpatkeil.d -o.\qd007a_ctl_app\
- stm32f1xx_sturamwalkpatkeil.o -ID:\SoftDesign\20190311_QD007A_CTL\TT-KZ-010A_CT
- RL_APP\TT-KZ-010A_CTRL_APP\MDK-ARM\RTE -IC:\Keil_v5\ARM\PACK\ARM\CMSIS\5.6.0\CM
- SIS\Core\Include -IC:\Keil_v5\ARM\PACK\Keil\STM32F1xx_DFP\2.3.0\Device\Include
- --predefine="__MICROLIB SETA 1" --predefine="__UVISION_VERSION SETA 515" --pred
- efine="_RTE_ SETA 1" --predefine="STM32F10X_MD SETA 1" --list=stm32f1xx_sturamw
- alkpatkeil.lst ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKEIL.s
- ARM Macro Assembler Page 1 Alphabetic symbol ordering
- Relocatable symbols
- .text 00000000
- Symbol: .text
- Definitions
- At line 7 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKEI
- L.s
- Uses
- None
- Comment: .text unused
- STU_FullRamWalkpat 000000F2
- Symbol: STU_FullRamWalkpat
- Definitions
- At line 177 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 178 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: STU_FullRamWalkpat used once
- STU_RamWalkpatStep 00000000
- Symbol: STU_RamWalkpatStep
- Definitions
- At line 28 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Uses
- At line 29 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Comment: STU_RamWalkpatStep used once
- __BACKGROUND_LOOP 00000074
- Symbol: __BACKGROUND_LOOP
- Definitions
- At line 92 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Uses
- At line 96 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Comment: __BACKGROUND_LOOP used once
- __BACKUP_LOOP 00000008
- Symbol: __BACKUP_LOOP
- Definitions
- At line 35 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Uses
- At line 41 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Comment: __BACKUP_LOOP used once
- __FULL_ERR 000001EA
- Symbol: __FULL_ERR
- Definitions
- At line 323 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 200 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 208 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- ARM Macro Assembler Page 2 Alphabetic symbol ordering
- Relocatable symbols
- EIL.s
- At line 216 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 222 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 230 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 238 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 269 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 277 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 285 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 291 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 299 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 307 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- __FULL_LOOP_1 000000FA
- Symbol: __FULL_LOOP_1
- Definitions
- At line 185 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 189 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_LOOP_1 used once
- __FULL_LOOP_2 00000172
- Symbol: __FULL_LOOP_2
- Definitions
- At line 254 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 258 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_LOOP_2 used once
- __FULL_RET 000001EC
- Symbol: __FULL_RET
- Definitions
- At line 326 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 321 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_RET used once
- __FULL_STEP_3 00000132
- Symbol: __FULL_STEP_3
- Definitions
- At line 218 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- ARM Macro Assembler Page 3 Alphabetic symbol ordering
- Relocatable symbols
- At line 213 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_STEP_3 used once
- __FULL_STEP_4 00000156
- Symbol: __FULL_STEP_4
- Definitions
- At line 240 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 235 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_STEP_4 used once
- __FULL_STEP_5 000001AC
- Symbol: __FULL_STEP_5
- Definitions
- At line 287 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 282 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_STEP_5 used once
- __FULL_STEP_6 000001D0
- Symbol: __FULL_STEP_6
- Definitions
- At line 309 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 304 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_STEP_6 used once
- __FULL_TEST_WORDS_LOOP 0000010A
- Symbol: __FULL_TEST_WORDS_LOOP
- Definitions
- At line 193 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 248 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_TEST_WORDS_LOOP used once
- __FULL_TEST_WORDS_LOOP_2 00000182
- Symbol: __FULL_TEST_WORDS_LOOP_2
- Definitions
- At line 262 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 317 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_TEST_WORDS_LOOP_2 used once
- __FULL_TEST_WORD_LOOP 00000110
- Symbol: __FULL_TEST_WORD_LOOP
- Definitions
- At line 196 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- ARM Macro Assembler Page 4 Alphabetic symbol ordering
- Relocatable symbols
- Uses
- At line 244 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_TEST_WORD_LOOP used once
- __FULL_TEST_WORD_LOOP_2 0000018A
- Symbol: __FULL_TEST_WORD_LOOP_2
- Definitions
- At line 265 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 313 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __FULL_TEST_WORD_LOOP_2 used once
- __RESTORE_LOOP 000000DA
- Symbol: __RESTORE_LOOP
- Definitions
- At line 144 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 149 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __RESTORE_LOOP used once
- __STEP_ERR 000000EA
- Symbol: __STEP_ERR
- Definitions
- At line 154 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 53 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- At line 58 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- At line 63 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- At line 68 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- At line 73 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- At line 78 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- At line 107 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 112 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 117 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 122 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 127 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- At line 132 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- __STEP_RET 000000EC
- Symbol: __STEP_RET
- ARM Macro Assembler Page 5 Alphabetic symbol ordering
- Relocatable symbols
- Definitions
- At line 157 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 152 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __STEP_RET used once
- __STEP_TEST_WORDS_LOOP 0000001C
- Symbol: __STEP_TEST_WORDS_LOOP
- Definitions
- At line 46 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Uses
- At line 87 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Comment: __STEP_TEST_WORDS_LOOP used once
- __STEP_TEST_WORDS_LOOP_2 00000084
- Symbol: __STEP_TEST_WORDS_LOOP_2
- Definitions
- At line 100 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 141 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __STEP_TEST_WORDS_LOOP_2 used once
- __STEP_TEST_WORD_LOOP 00000022
- Symbol: __STEP_TEST_WORD_LOOP
- Definitions
- At line 49 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Uses
- At line 83 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Comment: __STEP_TEST_WORD_LOOP used once
- __STEP_TEST_WORD_LOOP_2 0000008C
- Symbol: __STEP_TEST_WORD_LOOP_2
- Definitions
- At line 103 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 137 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __STEP_TEST_WORD_LOOP_2 used once
- __VERIFY_NEXT_1 00000124
- Symbol: __VERIFY_NEXT_1
- Definitions
- At line 210 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 203 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __VERIFY_NEXT_1 used once
- __VERIFY_NEXT_2 00000148
- ARM Macro Assembler Page 6 Alphabetic symbol ordering
- Relocatable symbols
- Symbol: __VERIFY_NEXT_2
- Definitions
- At line 232 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 225 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __VERIFY_NEXT_2 used once
- __VERIFY_NEXT_3 0000019E
- Symbol: __VERIFY_NEXT_3
- Definitions
- At line 279 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 272 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __VERIFY_NEXT_3 used once
- __VERIFY_NEXT_4 000001C2
- Symbol: __VERIFY_NEXT_4
- Definitions
- At line 301 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Uses
- At line 294 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatK
- EIL.s
- Comment: __VERIFY_NEXT_4 used once
- 28 symbols
- ARM Macro Assembler Page 1 Alphabetic symbol ordering
- External symbols
- FailSafePOR 00000000
- Symbol: FailSafePOR
- Definitions
- At line 11 in file ..\SelfTestUser\src_specific\stm32f1xx_STURamWalkpatKE
- IL.s
- Uses
- None
- Comment: FailSafePOR unused
- 1 symbol
- 363 symbols in table
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